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X-ray diffractometer

DX-2800 High-Resolution X-ray diffractometer

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Combined multi-function X-ray diffractometers and high-resolution X-ray diffractometers are widely used in various fields of structural analysis of various materials. The materials analyzed include: metal materials, inorganic materials, composite materials, organic materials, nano materials, and superconducting materials. The material states that can be analyzed include: powder samples, bulk samples, film samples, and micro-region micro-samples. Widely used in clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, minerals and other research fields.


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The high-resolution X-ray diffractometer is designed to accurately study the material structure, and can accurately measure the diffraction angle of the sample, laying a solid foundation for accurate and reliable phase analysis and structural analysis results.


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The high-resolution X-ray diffractometer is equipped with a high-stability X-ray source and a high-performance semiconductor array counter to obtain the most accurate diffraction spectrum in a relatively short period of time.

The diffraction angle of the sample is directly obtained by the absolute incremental 3.6 million line grating, which can avoid the influence of other components of the goniometer on the diffraction angle, and ensure that the instrument always obtains an accurate peak position within the service life.


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The angular deviation of all peaks in the full spectrum of the international standard sample (Si, Al2O3) is under ± 0.002 degrees.

The X-ray diffraction spectrum provides important information about the crystal structure of the different crystal phases of the sample. This information includes lattice constants, lattice types, atomic substitutions, grain size, and non-uniform stresses, and the crystal structure can be resolved step by step through the sample diffraction spectrum.